Optimizing Three Critical Factors for Practical and Effective OOD Detection Fine-Tuning (arxiv.org)
arXiv:2308.01030v2 Announce Type: replace
Abstract: In out-of-distribution (OOD) detection, fine-tuning with auxiliary outlier data often improves detection performance at the cost of classification accuracy. This trade-off stems from the loss of the original in-distribution (ID) distribution during fine-tuning. To establish a more practical and effective paradigm, we optimize three critical factors: model reminder, data sampling, and representation learning. We propose: (1) Self-Knowledge Distillation (SKD) to mitigate accuracy reduction; (2) Semi-hard Outlier Sampling (SOS) to improve detection efficiency with minimal data; and (3) Outlier-aware Supervised Contrastive Learning (OSCL) to promote ID-OOD separability. Optimizing these factors produces cumulative gains, boosting both OOD detection performance and classification accuracy. Our framework outperforms existing methods across diverse benchmarks, particularly in long-tailed scenarios, providing a robust baseline for real-world OOD detection.
Abstract: In out-of-distribution (OOD) detection, fine-tuning with auxiliary outlier data often improves detection performance at the cost of classification accuracy. This trade-off stems from the loss of the original in-distribution (ID) distribution during fine-tuning. To establish a more practical and effective paradigm, we optimize three critical factors: model reminder, data sampling, and representation learning. We propose: (1) Self-Knowledge Distillation (SKD) to mitigate accuracy reduction; (2) Semi-hard Outlier Sampling (SOS) to improve detection efficiency with minimal data; and (3) Outlier-aware Supervised Contrastive Learning (OSCL) to promote ID-OOD separability. Optimizing these factors produces cumulative gains, boosting both OOD detection performance and classification accuracy. Our framework outperforms existing methods across diverse benchmarks, particularly in long-tailed scenarios, providing a robust baseline for real-world OOD detection.
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